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  3. JEOL JSM-6390

JEOL JSM-6390 Scanning Electron Microscope Sem Edax Si Eds Detector

Jsm-6390 Jeol Scanning Electron Microscope Sem And Edax Si Li Detector Eds

( Brand: Jeol ), ( Part Type: Detector ), ( Microscope Type: Scanning Electron Microscope ), ( Manufacturer Part Number: JSM-6390 )

Review JEOL Scanning Electron Microscope Sem And Edax Si Li Detector Eds

The JEOL JSM-6390F Scanning Electron Microscope (SEM) with EDX SI Detector (EDS) is a versatile and advanced instrument designed for material characterization and analysis at the nanoscale. This microscope combines high-resolution imaging capabilities with powerful elemental analysis, making it an essential tool for researchers and scientists in various fields, including materials science, biology, physics, and engineering.

The JSM-6390F SEM is equipped with a high-resolution Schottky field emission gun that provides superior imaging performance and reduces electron beam instability. The electron beam can be scanned over large areas or small features with sub-nanometer resolution, revealing intricate surface topography and morphology in great detail.

The integrated EDX SI Detector in this JEOL SEM is capable of analyzing the elemental composition of samples with high accuracy and sensitivity. By detecting the X-rays emitted when the electron beam interacts with the sample, the EDS system can identify and quantify elements present in the sample, allowing for comprehensive material analysis. The detector's large take-off angle ensures that it can collect signals from a larger area around the focus point, providing more accurate and representative results.

Furthermore, the JSM-6390F SEM is designed for ease-of-use and versatility. Its intuitive user interface simplifies the operation of the microscope, while advanced software features facilitate data acquisition and analysis. The microscope also comes with an extensive library of preset conditions for various materials and sample types, enabling users to quickly obtain high-quality results.

Additionally, the JEOL JSM-6390F SEM is compatible with a range of sample preparation techniques and offers various observation modes, including secondary electron imaging (SEI), backscattered electron imaging (BSE), and energy filtered imaging (EFI). This versatility makes it suitable for analyzing various types of samples, from conductive to non-conductive materials, and for studying different aspects of their properties.

In summary, the JEOL JSM-6390F Scanning Electron Microscope with EDX SI Detector is an advanced and versatile instrument designed for high-resolution imaging and comprehensive analysis of materials at the nanoscale. Its superior performance, ease-of-use, and compatibility with various sample types make it an indispensable tool for researchers and scientists in diverse fields.

Scanning Electron Microscope (SEM) with Energy Dispersive X-ray Spectroscopy (EDX or EDXA or EDS) detector is a high-end and versatile instrument used for various applications in material science, biology, and other fields. Here are the pros and cons of buying a JEOL JSM-6390 SEM with EDX detector:

Pros:

1. High-resolution imaging: JEOL JSM-6390 SEM offers high-resolution imaging capability, enabling researchers to observe the surface features of materials at the nanometer scale with excellent depth of field.

2. Energy dispersive X-ray spectroscopy: The EDX detector provides elemental analysis of the sample, allowing users to identify and quantify various elements present in the material. This feature can be particularly useful in material chemistry and geology applications.

3. Versatility: The JSM-6390 SEM with EDX detector is a versatile instrument that can be used for a wide range of applications, including failure analysis, semiconductor characterization, biology, and geology.

4. Easy to use: This SEM model is known for its user-friendly design and intuitive interface, which simplifies the process of sample preparation, imaging, and data analysis.

5. Durable and reliable: JEOL is a reputed brand in the field of electron microscopes, and the JSM-6390 SEM is renowned for its robustness and longevity, ensuring minimum downtime and maximum productivity.

6. Accurate and precise: This advanced microscope allows for accurate and precise measurement of surface topography and elemental composition, ensuring consistently high-quality results.

Cons:

1. High cost: A SEM with EDX detector like the JEOL JSM-6390 is a significant investment. The high initial cost may hinder small research groups or individuals from purchasing it.

2. Complex setup and maintenance: Compared to other types of microscopes, SEMs require a more complex setup and routine maintenance. It may ensure having sufficient resources and time for proper calibration, maintenance, and training of operators.

3. Sample preparation: Proper sample preparation is essential to obtain accurate and reliable results with a SEM. The process can be time-consuming and tedious, as it requires special skills and equipment.

4. Limited depth of field: Although the JSM-6390 offers high resolution, its depth of field is limited, which can make it challenging to image thicker samples or complex 3D structures.

5. Radiation damage: SEM imaging involves bombarding the sample with a high-energy electron beam, which can cause radiation damage, particularly for sensitive materials like biological samples.

Conclusion:

In conclusion, an SEM with EDX detector, such as JEOL JSM-6390, is a valuable tool for various research and development applications, offering unparalleled imaging capabilities and elemental analysis. While it comes with an initial high investment and requires complex setup and maintenance, the benefits of having this advanced instrument often outweigh the drawbacks. For researchers and organizations with sufficient resources, it can be a game-changer in achieving new insights and progressing their fields.

Recommendation:

For individuals or organizations considering the purchase of an SEM with an EDX detector, the JEOL JSM-6390 is a solid investment due to its exceptional imaging abilities, dependability, and longevity. It is essential to thoroughly consider the intended application, budget, and available resources before making the final decision. Proper preparation, training, and maintenance will ensure optimal performance and accurate results from the instrument.

Details:

Back scatter detector - all 4 quadrants working. Turbo pumped, requires no chiller or air compressor. Computer table not included. JEOL SEM with EDAX EDS detector in great condition.

Installation, training and maintenance available. APEX software with MAPPING. Dis-assembly and packing by service engineer.

part #: jsm6390 price

  • $9450.00

specifications curativescope:

  • brand: Jeol
  • part type: Detector
  • microscope type: Scanning Electron Microscope
  • manufacturer part number: JSM-6390

seller curativescope:

  • # reviews: 1086
  • rating: 100.0%
  • city: Laguna Hills, California

returns curativescope:

  • policy: No Returns

general curativescope:

  • condition: Used
  • Healthcare, Lab Dental > Medical Lab Equipment, Devices > Microscopes

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offer curativescope:

  • options: Ship-to-home
  • best offers: True
  • started: January 19, 2025
  • quantity: 1
  • availability: In Stock
  • sold: 0

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part type: detector, microscope type: scanning electron microscope,
category: business & industrial > healthcare, lab dental > medical lab equipment, devices > microscopes, sku: 1616249253897671,

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1 offer $9450.00 USD
  • For parts or not working. Offer #1 priced at $9450.00 + $1500.00 delivery = $10950.00* total. "Standardless" quantitative analyses give an accuracy of 1-2%, while ultimate accuracy can be obtained by spectral comparison to known standards. CONDITION: For Parts.+$1500.00 shipping

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