HITACHI S-4700 Scanning Electron Microscope Edax

( Brand: Hitachi ), ( Microscope Structure: Upright ), ( Microscope Type: Scanning Electron Microscope ), ( Viewer: Monitor/display ), ( Manufacturer Part Number: S-4700 )

Review HITACHI Scanning Electron Microscope Edax

The Hitachi S-4700 Field Emission Scanning Electron Microscope (FE-SEM) with Energy Dispersive X-ray Analysis (EDX) system is a versatile and powerful instrument designed for advanced material characterization and analysis. This instrument offers high-resolution imaging and precise elemental analysis capabilities, making it an essential tool for researchers and industry professionals in various fields, including materials science, electronics, geology, and biology.

The Hitachi S-4700 FE-SEM is equipped with a field emission gun, which provides a high-resolution electron beam with a small spot size, enabling the observation of fine details at the nanometer scale. The instrument offers a wide range of magnifications, from 10x to over 300,000x, and a large working distance, allowing for the analysis of bulky samples or samples with delicate features.

The integrated EDX system in the Hitachi S-4700 FE-SEM is capable of detecting and identifying elements with atomic numbers from Boron (Z 5) to Uranium (Z 92) and beyond. The system includes a large-area Si(Li) detector, which provides high-sensitivity elemental analysis with a spatial resolution of less than 20 nm. The instrument also offers various quantification methods, such as peak area percentage, weight percentage, and elemental mapping, enabling the user to obtain valuable information about the elemental composition and distribution in the sample.

The Hitachi S-4700 FE-SEM comes with user-friendly software for data acquisition and analysis, including the Hitachi Software Suite (HSU) and the EDX data analysis software, INCA. The software allows for easy control of the instrument, data acquisition, and data analysis, including the ability to generate 2D and 3D images, elemental maps, and line profiles. The system is also compatible with various sample preparation techniques, such as coating with conductive materials, allowing for the analysis of non-conductive samples.

In summary, the Hitachi S-4700 FE-SEM with EDX is a high-performance instrument designed for advanced material characterization and analysis. Its high-resolution imaging and precise elemental analysis capabilities make it an essential tool for researchers and industry professionals in various fields, offering valuable insights into the microstructure and composition of materials.

The Hitachi S-4700 Scanning Electron Microscope (SEM) with Energy Dispersive X-ray Analysis (EDX) is a high-end instrument used for examining the surface characteristics of various materials. Here are some pros and cons that can help in making a decision to buy this particular SEM model:

1. High-Resolution Imaging: The Hitachi S-4700 SEM provides high-resolution images with a magnification range of up to 300,000x.

2. Energy Dispersive X-ray Analysis (EDX): The integrated EDX system enables the analysis of elemental composition of the sample.

3. Versatile: It can be used for various applications such as failure analysis, material research, semiconductor inspection, and biology.

4. User-friendly: The instrument comes with software that makes data acquisition and analysis easy.

5. High Vacuum and Low Vacuum Modes: It supports both high vacuum and low vacuum modes, making it suitable for a wide range of sample types.

1. High Cost: The Hitachi S-4700 SEM with EDX is an expensive instrument, and the cost of maintenance and consumables can also be significant.

2. Complexity: The operation of the instrument requires a certain level of expertise, and regular calibration and maintenance are necessary for optimal performance.

3. Sample Preparation: Proper sample preparation is crucial for obtaining accurate results, which can be time-consuming and labor-intensive.

4. Radiation: The instrument emits radiation during operation, which can pose a safety risk and require additional precautions.

The Hitachi S-4700 SEM with EDX is a powerful and versatile instrument that offers high-resolution imaging and elemental analysis capabilities. However, it comes with a high cost, complexity, and safety considerations. Therefore, it is recommended for laboratories or research institutions that require a high-end SEM for advanced material analysis applications. For less complex applications, or for those with a smaller budget, other less expensive SEM models may be more suitable.

Details:

So this is a huge discount. A Hitachi SEM model S-4700 with EDAX is available. Maintained Hitachi service over entire length of ownership and had the system refurbished recently. No longer need and willing to sell at great price.This is a petrology tool that can image measure features down few nanometers.

EDAX enables chemical analysis of samples under image. Sold AS IS and WHERE. Was bought new for over $450K and used infrequently. Has been a great tool with fantastic up times and no problems.

part #: s4700 prices

• $2100.00-$35000.00

specifications curativescope:

• brand: Hitachi
• microscope structure: Upright
• microscope type: Scanning Electron Microscope
• viewer: Monitor/display
• manufacturer part number: S-4700

payments curativescope:

• credit card: Discover
• wallet: Apple-pay

general curativescope:

• condition: Seller refurbished
• Healthcare, Lab Dental > Medical Lab Equipment, Devices > Microscopes

returns curativescope:

• policy: No Returns

offer curativescope:

• quantity: 1
• best offers: True
• availability: In Stock
• sold: 0
• options: Ship-to-home
• started: August 24, 2025

shipping curativescope:

• class: Freight
• cost: $5000.00
• type: Fixed
• service: Flat Rate Freight

seller curativescope:

• rating: 100.0%
• # reviews: 1
• city: Chantilly, Virginia

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