
( Brand: Tescan ), ( Model: VEGA2 XMU ), ( Microscope Type: Tescan Vega3 Lmu Scanning Electron Microscope ), ( Country/region Of Manufacture: United States ), ( Manufacturer Part Number: VEGA2 )
The TESCAN Vega2 and Vega XMU scanning electron microscopes (SEMs) from TESCAN, in collaboration with Oxford Instruments, are advanced and versatile instruments designed for high-resolution imaging and analysis of various types of samples. These SEMs come equipped with the Oxford X-MAX 50 EDS system, which provides state-of-the-art energy-dispersive X-ray spectroscopy (EDS) capabilities.
The TESCAN Vega2 and Vega XMU SEMs boast an advanced column design, which guarantees high resolution and excellent imaging performance. The instruments offer a wide range of operational modes, including secondary electron imaging (SEI), backscattered electron imaging (BEI), and low vacuum imaging. The low vacuum capability facilitates the analysis of non-conductive and hydrated samples, broadening the scope of applications.
The Oxford X-MAX 50 EDS system integrated into these SEMs delivers high-sensitivity spectroscopic analysis. It is capable of detecting elements with an atomic number as low as boron (Z 5). The system provides a large, ultra-thin window detector, which ensures minimal beam damage and offers a wider field-of-view during EDS analysis. The system is also equipped with advanced features such as ZAF matrix correction for accurate quantitative analysis and the ability to perform mapping analyses.
The TESCAN Vega2 and Vega XMU SEMs offer a user-friendly interface, with a touchscreen control panel and intuitive software. The instruments come with the TESCAN MAPS software package, which includes functions for data acquisition, analysis, and processing. Additionally, the system supports various interfaces for easy data transfer and compatibility with other software packages.
These advanced SEMs from TESCAN and Oxford Instruments are designed for high-performance analysis in various fields such as materials science, semiconductor industry, biology, and research institutions. The instruments deliver superior imaging and analysis capabilities, making them an essential tool for researchers and professionals seeking to explore the microstructure and composition of their samples in detail.
a. High-resolution imaging capability with a wide range of magnifications (5 nm to 300,000x).
b. Versatile with various detectors for secondary electrons (SE), backscattered electrons (BSE), energy-dispersive X-ray spectroscopy (EDS), and in-lens SE for depth profiling.
c. User-friendly software for image acquisition and analysis.
d. Automated functions for easy operation.
e. Limited working distance, which may not be suitable for larger samples.
2. TESCAN VEGA-XMU:a. Improved X-ray microanalysis capabilities with an advanced EDS system (INCA X-act).
b. Quadruple detector system for EDS, BSE, SE, and cathodoluminescence (CL) imaging.
c. Large working distance for larger samples.
d. Enhanced imaging capabilities with a new generation of detectors.
e. Higher price point due to advanced features.
3. OXFORD X-MAX 50 EDS:a. High-performance EDS system with a large active area detector and high count rate capability.
b. Advanced data processing capabilities, including peak fitting, background subtraction, and quantitative analysis.
c. Flexible and can be used in various applications, including semiconductor, materials science, and biological research.
d. Easy integration with other Oxford Instruments systems for combined techniques.
e. Limited imaging capabilities compared to scanning electron microscopes with integrated imaging systems.
Conclusion:All three microscopes offer unique features that cater to different research needs. TESCAN VEGA2 is an excellent choice for researchers who require high-resolution imaging and versatility. TESCAN VEGA-XMU is ideal for those who need advanced X-ray microanalysis capabilities and larger working distances. OXFORD X-MAX 50 EDS is perfect for researchers who require high-performance EDS systems and easy integration with other Oxford Instruments systems.
Recommendation:Consider your research requirements, budget, and the unique features of each microscope to make an informed decision. If you need high-resolution imaging and versatility, the TESCAN VEGA2 is recommended. If you require advanced X-ray microanalysis capabilities and larger working distances, the TESCAN VEGA-XMU is recommended. If you need a high-performance EDS system with easy integration with other Oxford Instruments systems, the OXFORD X-MAX 50 EDS is recommended.
Oxford Inca software, including EDS mapping fully licensed. GOOD WORKING Tescan Vega II XMU scanning electron microscope with Oxford X-Max 50 SDD detector for EDS. Fully motorized stage including X, Y, Z, Tile and Rotation. Will crate for shipping.
Features, Extra large chamber. Oxford X-Max 50mm 2 SDD detector for EDS. Back scatter and secondary electron detectors.